We recently constructed a high energy ion scattering (HEIS) setup in which
samples can be cooled to cryogenic temperatures to suppress ion beam induce
d damage in polymers. A closed cycle helium gas cooler provides the cooling
power of 2 W at 10 K. The setup is equipped with a sample mount that enabl
es sample exchange via a load lock system, while ensuring a good thermal co
ntact with the sample holder by a shrink coupling.
We investigated the effects of sample cooling on HEIS measurements on model
polymer light emitting diodes and polyacrylate films. It can be concluded
that hydrogen loss can be decreased from 50% to 10% for the same irradiatio
n dose, and much more accurate depth profiling of elements is possible. (C)
2000 Elsevier Science B.V. All rights reserved.