Citation
R. Van Ham et al., Molecular information in static SIMS for the speciation of inorganic compounds, NUCL INST B, 161, 2000, pp. 245-249
Citations number
8
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168583X
→ ACNP
Volume
161
Year of publication
2000
Pages
245 - 249
Database
ISI
SICI code
0168-583X(200003)161:<245:MIISSF>2.0.ZU;2-5
Abstract
This paper presents a systematic study of pure inorganic binary salts using
a time-of-flight (TOF) static secondary ion mass spectroscopy (S-SIMS) ins
trument. The objective was to evaluate the method's capability to achieve m
olecular speciation of binary salts. The results show the feasibility of di
rect speciation in a deductive manner without the need for reference spectr
a. Also ratioing intensities of specific high-mit cluster ions can differen
tiate compounds with the same elements in different oxidation states. (C) 2
000 Elsevier Science B.V. All rights reserved.