Preparation and properties of lead titanate thin ferroelectric films

Citation
As. Sidorkin et al., Preparation and properties of lead titanate thin ferroelectric films, PHYS SOL ST, 42(4), 2000, pp. 745-750
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICS OF THE SOLID STATE
ISSN journal
10637834 → ACNP
Volume
42
Issue
4
Year of publication
2000
Pages
745 - 750
Database
ISI
SICI code
1063-7834(2000)42:4<745:PAPOLT>2.0.ZU;2-#
Abstract
A new technique is proposed for preparing lead titanate ferroelectric films . The technique involves a solid-phase reaction in an oxygen environment be tween titanium and lead layers deposited on a substrate. The thicknesses of the component films being deposited are chosen based on the stoichiometric ratio in the compound to be synthesized. The composition and structure of the film obtained are checked by x-ray phase analysis. The films exhibit a dielectric hysteresis loop and a temperature dependence of the permittivity characteristic of ferroelectrics. A study has been made of the temperature and thickness dependences of the film coercive field. They also are shown to follow a pattern typical of ferroelectrics. (C) 2000 MAIK "Nauka/ Interp eriodica".