Polymers are often subjected to aggressive environments where mechanical an
d chemical mechanisms may act synergistically to degrade the polymers. This
research focused on the effects of stress and sulfur dioxide (SO2) environ
ments on ultrahigh molecular weight poly ethylene (UHMWPE) fibers (Spectra(
R)). Spectra(R) yam specimens were exposed to stress, SO2, and/or near ultr
aviolet (UV) light environments. Degradation, a decrease in tensile propert
ies, was measured by tensile testing specimens immediately after exposure t
o the stress/environment conditions. Creep lifetime degradation of Spectra(
R) single fiber specimens was also measured in SO2 and/or near UV light env
ironments. The Spectra(R) fibers were found to degrade due to the applied s
tress. This was evidenced by a decrease in the ultimate strength subsequent
to an applied creep load and the short creep lifetimes. No chemical degrad
ation was observed, nor were any mechanical-chemical synergisms observed du
e to the SO2 and/or near UV light environments. The creep lifetimes of the
Spectra(R) fibers, however, increased slightly in environments of SO2 and/o
r near UV light. The degradation of the Spectra(R) fibers is consistent wit
h their fibrillar morphology and was attributed to chain scission of the in
terfibrillar tie chains due to the applied creep load. Since no degradation
of the Spectra(R) was observed in the SO2 and/or near UV light environment
s, it was concluded that it is relatively insensitive to environmental atta
ck from SO2 and/or near UV light. The increase in the creep lifetimes of th
e Spectra fibers suggests that the SO2 and/or near UV light does affect the
Spectra(R) fibers. Based on this and the work of other researchers, it is
hypothesized that the SO2 and/or near UV light are, to a limited extent, ca
pable of crosslinking or branching linear polyethylene molecules. Such cros
slinking or branching appears to be minimal, altering only the creep lifeti
mes and leaving the other tensile properties largely unaffected. (C) 2000 E
lsevier Science Ltd. All rights reserved.