Characterization of combinatorially designed polyarylates by time-of-flight secondary ion mass spectrometry

A series of 16 polyarylates, with well-controlled and systematically varyin g chemistry, has been characterized by time-of-flight secondary ion mass sp ectrometry (TOF-SIMS). The polymers are structurally identical except for t he incremental additions of C2H4 units to the backbone and sidechain. From the spectra, peaks characteristic of all polyarylates are identified, Furth ermore, evaluation of the spectra and identification of unique signals allo w classification of the polyarylates according to sidechain and backbone ch emistry. Copyright (C) 2000 John Whey & Sons, Ltd.