R. Datta et al., Intraspecific genetic variability analysis of Neovossia indica causing Karnal bunt of wheat using repetitive elements, THEOR A GEN, 100(3-4), 2000, pp. 569-575
Neovossia indica (Tilletia indica), causing Karnal bunt of wheat, affects m
ajor wheat growing regions all over the world. Karnal bunt ranks as one of
the major diseases of wheat causing quality losses and monetary losses due
to international quarantine regulations. The present work is the first repo
rt of a genetic diversity analysis of Indian isolates of N. indica. A libra
ry of N. indica isolate Ni7 was constructed in a lambda ZAPII system, and t
hree repetitive elements were identified for molecular analysis. These repe
titive elements generated complex hybridization profiles producing fingerpr
int patterns of all seven isolates. Copy-number estimation of these three e
lements, pNiR9, pNiR12 and pNiR16 indicated the presence of 32, 61 and 64 c
opies, respectively. Cluster analysis based on hybridization patterns group
ed together moderately virulent isolates Nil, Ni7 and Ni8, thus suggesting
a positive correlation between virulence typing and cluster analysis based
on molecular data. Variability analysis of N. indica isolates will aid in c
hecking new resistant sources in host germplasm.