Maps recorded by micro-proton-induced x-ray emission (micro-PIXE) were obta
ined for different chemical elements for natural and synthetic emeralds. Ei
ghty pieces of natural and synthetic stones were examined. The following in
clusions and minerals were observed: (1) color zoning/elemental zoning; (2)
brine components; (3) calcite/dolomite; (4) chromite/magnetite; (5) pyrite
and the accompanying sphalerite/wurtzite; (6) mica (biotite, phlogopite an
d muscovite); (7) feldspar (orthoclase and anorthite of plagioclase); (8) f
lux residues/nutrient residues; and (9) seed crystal. These (a) demonstrate
d the power of micro-PIXE in revealing inclusions in emeralds, which was us
eful for easy and unambiguous identification, and which made the identifica
tion of inclusions in rough stones possible; (b) provided some criteria for
discrimination between natural and synthetic emeralds; and (c) gave the so
urce of some chemical elements, so that their presence derived from the PIX
E spectra would be further supported (e,g, Cl in the brine component in nat
ural and flux grown emeralds; Cl was previously said to be present only in
hydrothermal grown emeralds). Furthermore, the present work showed the powe
r of micro-PIXE in the in situ study of minerals. Copyright (C) 2000 John W
iley & Sons, Ltd.