Scanning field emission from patterned carbon nanotube films

Citation
L. Nilsson et al., Scanning field emission from patterned carbon nanotube films, APPL PHYS L, 76(15), 2000, pp. 2071-2073
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
15
Year of publication
2000
Pages
2071 - 2073
Database
ISI
SICI code
0003-6951(20000410)76:15<2071:SFEFPC>2.0.ZU;2-S
Abstract
The investigation of the field emission (FE) properties of carbon nanotube (CNT) films by a scanning anode FE apparatus, reveals a strong dependence o n the density and morphology of the CNT deposit. Large differences between the microscopic and macroscopic current and emission site densities are obs erved, and explained in terms of a variation of the field enhancement facto r beta. As a consequence, the emitted current density can be optimized by t uning the density of CNTs. Films with medium densities (on the order of 10( 7) emitters/cm(2), according to electrostatic calculations) show the highes t emitted current densities. (C) 2000 American Institute of Physics. [S0003 -6951(00)00815-9].