Va. Joshkin et al., Growth of oriented lithium niobate on silicon by alternating gas flow chemical beam epitaxy with metalorganic precursors, APPL PHYS L, 76(15), 2000, pp. 2125-2127
We present the results of investigations of LiNbO3 film growth on Si by con
ventional chemical beam epitaxy (CBE) and by alternating gas flow depositio
n with alkoxide precursors. Both growth methods produced films with an inte
rvening interface amorphous layer, whose thickness depends strongly on grow
th and annealing temperatures. While films grown by chemical beam epitaxy w
ere always polycrystalline, the LiNbO3 films grown by alternating gas flow
deposition were oriented materials. Based on our studies, we hypothesize th
at the alternating layer deposition technique enhances bulk interdiffusion
efficiency of metal ions leading to a more controlled epitaxy of LiNbO3 on
Si relative to conventional CBE growth. (C) 2000 American Institute of Phys
ics. [S0003-6951(00)04115-2].