Combining x-ray and optical spectroscopies in the study of dilute semiconductor nanoparticle composites

We discuss a methodology for the cooperative analysis of optical and x-ray spectroscopies to deduce the thermophysical properties of dilute suspension s of semiconductor nanoparticles in a wide band gap host. X-ray spectroscop y is used to determine concentration and bonding of selected elements. Reso nant Raman spectroscopy establishes limits on composition and strain in par ticles. Analysis of optical absorption, with constraints provided by x-ray and Raman measurements, yields the particle size distribution and concentra tion. As an example of this approach, we study borosilicate glasses doped w ith similar to 0.1 wt% CdS and heat treated to produce nanoparticles. (C) 2 000 American Institute of Physics. [S0021-8979(00)03508-8].