Multilayer mirror soft x-ray spectrometer for fast electron temperature measurement on the compact helical system

Authors
Lee, S Duorah, S Ejiri, A Iguchi, H Fujisawa, A Ishiyama, E Takase, Y Toyama, H Aramaki, M Kojima, M Okamura, S Matsuoka, K
Citation
S. Lee et al., Multilayer mirror soft x-ray spectrometer for fast electron temperature measurement on the compact helical system, REV SCI INS, 71(4), 2000, pp. 1671-1674
Citations number
19
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
71
Issue
4
Year of publication
2000
Pages
1671 - 1674
Database
ISI
SICI code
0034-6748(200004)71:4<1671:MMSXSF>2.0.ZU;2-E
Abstract
A multilayer mirror (MLM) soft x-ray spectrometer has been installed on the Compact Helical System. The x-ray energy spectrum from ECH and neutral bea m injected heated low beta plasmas was measured as a function of radiation energy. Modulations of the x-ray intensity associated with magnetohydrodyna mic instability were observed. The electron temperature measurement was als o investigated using the MLM x-ray spectrometer. The data suggest the possi bility of a fluctuation measurement of the electron temperature T-e with fa st time resolution using the MLM spectrometer. (C) 2000 American Institute of Physics. [S0034-6748(00)04303-3].