Simultaneous measurements of small angle x-ray scattering, wide angle x-ray scattering, and dielectric spectroscopy during crystallization of polymers

A novel experimental setup is described which allows one to obtain detailed information on structural and dynamical changes in polymers during crystal lization. This technique includes simultaneous measurements of small angle- wide angle x-ray scattering and dielectric spectroscopy (SWD). The capabili ties of the technique have been probed by following in real time the crysta llization process of a model crystallizable polymer: poly(ethylene terephth alate). By performing these experiments, simultaneous information from both , the amorphous and the crystalline phase is obtained providing a complete description of changes occurring during a crystallization process. The SWD technique opens up new promising perspectives for the experimental study of the relation between structure and dynamics in materials science. (C) 2000 American Institute of Physics. [S0034-6748(00)01004-2].