Total-reflection X-ray fluorescence analysis of geological microsamples

The major and minor components of single inclusion-fret crystals with diame ters of approximately 1 mm of a naturally occurring garnet were quantitativ ely determined by use of electron microprobe analysis (EMPA) with EDX- and WDX-spectrometry. In order to check the EMPA-results single garnet crystals were separated mechanically, decomposed chemically and the sample solution s were investigated by total-reflection X-ray fluorescence analysis (TXRF). Results obtained by TXRF as well as by EMPA of the major and minor compone nts are in good agreement. The accuracy and precision of the applied method s were checked by an additional investigation of certified corundum and bas altic reference materials. The results of this preliminary work show that t he combination of a suitable decomposition technique followed by TXRF measu rement is an accurate tool for the chemical characterisation of mineralogic al and geological microsamples. (C) 2000 Elsevier Science B.V. All rights r eserved.