Determination of multilayer relaxations of the Cu(210) stepped surface by calculation of LEED intensities

Citation
Yp. Guo et al., Determination of multilayer relaxations of the Cu(210) stepped surface by calculation of LEED intensities, SURF REV L, 6(5), 1999, pp. 819-824
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SURFACE REVIEW AND LETTERS
ISSN journal
0218625X → ACNP
Volume
6
Issue
5
Year of publication
1999
Pages
819 - 824
Database
ISI
SICI code
0218-625X(199910)6:5<819:DOMROT>2.0.ZU;2-1
Abstract
In this report, we investigate the surface multilayer relaxation of clean C u(210) by the Barbieri/Van Hove symmetrized automated tensor LEED calculati on, based upon the multiple scattering theory. We have examined the change of Pendry R factor as a function of the structural and nonstructural variab les in the calculation. The results show that a R-p factor of 0.20 can be a chieved when the top 10 interlayer spacings of clean Cu(210) were optimized to experimental data using a muffin-tin radius of 1.217 Angstrom and a muf fin-tin zero of 8 eV. The first three interlayer spacings are d(12) = 0.761 +/- 0.04 Angstrom, d(23) = 0.759 +/- 0.04 Angstrom and d(34) = 0.862 +/- 0 .03 Angstrom, respectively (versus the bulk value of 0.807 Angstrom). It th erefore appears that the Cu(210) surface contracts to some extent, decreasi ng the surface roughness. The strain-induced multilayer relaxation of Cu(21 0) surface is discussed.