Room-temperature Al single-electron transistor made by electron-beam lithography

Citation
Ya. Pashkin et al., Room-temperature Al single-electron transistor made by electron-beam lithography, APPL PHYS L, 76(16), 2000, pp. 2256-2258
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
16
Year of publication
2000
Pages
2256 - 2258
Database
ISI
SICI code
0003-6951(20000417)76:16<2256:RASTMB>2.0.ZU;2-6
Abstract
We present a lithographically made Al single-electron transistor that shows gate modulation at room temperature. The temperature dependence of the mod ulation agrees with the orthodox theory, however, energy-level quantization in a tiny metallic island affects the device characteristics below 30 K. T he charge-equivalent noise of the device at 300 K was measured to be simila r to 4x10(-2) e/Hz(1/2) at 1 Hz and is expected to be 1000 times lower in t he white-noise regime at higher frequencies. (C) 2000 American Institute of Physics. [S0003-6951(00)01416-9].