The interplay of bake oven processing environment and surface/interfacial c
hemistry, and their effect on intercoat adhesion has been investigated for
a model primer/electrocoat paint system. X-ray photoelectron spectroscopy (
XPS) surface analysis established that a prominent ether component in the C
1s core level spectrum correlated with a polyether-based crater-control ad
ditive in the electrocoat that surface-segregates during cure. Laboratory-s
imulated bake oven experiments confirmed that better adhesion characteristi
cs were realized by removal of this electrocoat overlayer through reaction
with nitrogen oxides and high levels of moisture present in the cure enviro
nment of production direct-fired ovens. Details of the effect of bake oven
atmosphere on cure chemistry for direct- versus indirect-fired ovens are pr
esented.