Preferred orientation of copper phthalocyanine thin films evaporated on amorphous substrates

A series of copper phthalocyanine thin films were prepared on amorphous sub strates using physical vapor deposition at ambient temperature. Different s ample preparation conditions were used: the deposition rate was varied, and the substrates was static or rotating. The preferred orientation in the th in film was studied as a function of the deposition conditions. X-ray diffr action analysis was performed using theta/2 theta and pole figure measureme nts. In the case of layers prepared at low deposition rates and using nonro tating: substrates, a very strong fiber texture was detected with (100) cry stallographic planes oriented preferably parallel to the substrate surface. At higher deposition rates, an additional second type of preferred orienta tion was observed with (110) planes oriented preferably parallel to the sub strate surface. In the case of layers prepared with rotational substrates, the (110) type of preferred orientation was quantitatively more strongly de veloped, If we consider electronic band structure calculations, these resul ts imply that the electron/hole transport through the thin films is enhance d for films prepared at high deposition rates and rotating substrates.