Alleviation of temperature effects in the Raman micro-spectroscopy of boron doped silicon microstructures

Authors
Lourenco, MA Gardiner, DJ Gouvernayre, V Bowden, M Hedley, J Wood, D
Citation
Ma. Lourenco et al., Alleviation of temperature effects in the Raman micro-spectroscopy of boron doped silicon microstructures, J MAT SCI L, 19(9), 2000, pp. 771-773
Citations number
4
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE LETTERS
ISSN journal
02618028 → ACNP
Volume
19
Issue
9
Year of publication
2000
Pages
771 - 773
Database
ISI
SICI code
0261-8028(200005)19:9<771:AOTEIT>2.0.ZU;2-K