Characterization of polymeric films by ellipsometry

Authors
Svorcik, V Ticha, H Rybka, V Hnatowicz, V
Citation
V. Svorcik et al., Characterization of polymeric films by ellipsometry, J MAT SCI L, 19(8), 2000, pp. 679-681
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE LETTERS
ISSN journal
02618028 → ACNP
Volume
19
Issue
8
Year of publication
2000
Pages
679 - 681
Database
ISI
SICI code
0261-8028(200004)19:8<679:COPFBE>2.0.ZU;2-V