K. Kawatsura et al., COPPER-L-X-RAY-SPECTRA MEASURED BY A HIGH-RESOLUTION ION-INDUCED X-RAY SPECTROMETER, Radiation physics and chemistry, 49(6), 1997, pp. 617-622
Citations number
10
Categorie Soggetti
Nuclear Sciences & Tecnology","Chemistry Physical","Physics, Atomic, Molecular & Chemical
High resolution L X-ray emission spectra of Cu have been measured by 0
.75 MeV/u H, He, and F, 0.73 MeV/u Ar, 0.64 MeV/u Si, and 0.073 MeV/u
Si ion impacts with a crystal spectrometer. The X-ray transition energ
ies in the Cu target for L iota, L eta, L alpha(1,2), L beta(1), and L
beta(3,4) diagram lines induced by H ion impact are determined, which
are in good agreement with those given in the reference by Bearden (R
ev. Mod. Phys. 39, 78, 1967). The X-ray spectra produced by F, Si, and
Ar ions have complicated structures due to multiple L and M shell vac
ancy production. The L alpha(1,2) and L beta(1) emission spectra for H
and He ions are compared with the calculated ones based on the multic
onfiguration Dirac-Fock method. The origin of the broadening of the L
alpha(1,2) line to the lower energy for H ion impact is attributed to
one 2p plus one 3d electron vacancy production. (C) 1997 Elsevier Scie
nce Ltd.