Frustrated total internal reflection evanescent switching

Citation
Y. Zhu et al., Frustrated total internal reflection evanescent switching, OPT LASER T, 31(8), 1999, pp. 539-542
Citations number
6
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTICS AND LASER TECHNOLOGY
ISSN journal
00303992 → ACNP
Volume
31
Issue
8
Year of publication
1999
Pages
539 - 542
Database
ISI
SICI code
0030-3992(199911)31:8<539:FTIRES>2.0.ZU;2-E
Abstract
The mechanism of frustrated total internal reflection was analyzed accordin g to the theory of optical film. The transmission and refection functions w ere developed and the curves of transmission and reflection changing from t he relative gap width d/lambda, incident angle theta(0), and refraction ind ex n were shown in graphs. We proposed a scheme of experimental device to t est the theoretical conclusion. A self-made electronic actuator drove the p iezoelectric ceramics of FTIR. Experiments showed that the evanescent of tr ansmission is 80% for He-Ne laser and smaller for YAG laser and Er:glass la ser. (C) 2000 Elsevier Science Ltd. All rights reserved.