In-process roughness measurement on moving surfaces

Authors
Wong, PL Li, KY
Citation
Pl. Wong et Ky. Li, In-process roughness measurement on moving surfaces, OPT LASER T, 31(8), 1999, pp. 543-548
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTICS AND LASER TECHNOLOGY
ISSN journal
00303992 → ACNP
Volume
31
Issue
8
Year of publication
1999
Pages
543 - 548
Database
ISI
SICI code
0030-3992(199911)31:8<543:IRMOMS>2.0.ZU;2-H
Abstract
A new optical technique, which utilises the combined effects of interferenc e and light scattering, was developed for surface roughness measurements. T his paper presents the technique applicable to extracting the roughness of moving surfaces under high rotational speeds up to 3.7 m/s. The applicabili ty of the technique to in-process roughness measurement was demonstrated wi th a cylindrical grinding process. (C) 2000 Elsevier Science Ltd. All right s reserved.