DETERMINATION OF TRAP DEPTHS ASSOCIATED WITH TL PEAKS IN SYNTHETIC QUARTZ (350-550K)

Citation
Sa. Petrov et Ik. Bailiff, DETERMINATION OF TRAP DEPTHS ASSOCIATED WITH TL PEAKS IN SYNTHETIC QUARTZ (350-550K), Radiation measurements, 27(2), 1997, pp. 185-191
Citations number
26
Categorie Soggetti
Nuclear Sciences & Tecnology
Journal title
ISSN journal
13504487
Volume
27
Issue
2
Year of publication
1997
Pages
185 - 191
Database
ISI
SICI code
1350-4487(1997)27:2<185:DOTDAW>2.0.ZU;2-B
Abstract
The thermoluminescence of annealed synthetic quartz has been investiga ted in the temperature region 350-550 K; the trap parameters for a num ber of TL peaks within this region of the glow curve have been determi ned using the fractional glow technique. The experimentally obtained v alues of thermal trap depth have been corrected for the effect of ther mal quenching; the new correction accommodates an arbitrary form of in ternal thermal quenching behaviour that is assumed to be appropriate f or quartz. Radioluminescence measurements were also performed to evalu ate the variation in luminescence with sample temperature. (C) 1997 El sevier Science Ltd.