In-situ transmission electron microscopy study of ion-irradiated copper: temperature dependence of defect yield and cascade collapse

Citation
Tl. Daulton et al., In-situ transmission electron microscopy study of ion-irradiated copper: temperature dependence of defect yield and cascade collapse, PHIL MAG A, 80(4), 2000, pp. 809-842
Citations number
48
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS ANDMECHANICAL PROPERTIES
ISSN journal
13642804 → ACNP
Volume
80
Issue
4
Year of publication
2000
Pages
809 - 842
Database
ISI
SICI code
1364-2804(200004)80:4<809:ITEMSO>2.0.ZU;2-B
Abstract
High-energy neutrons and ions incident upon a solid can initiate displaceme nt collision cascades of lattice atoms which result in localized volumes wi thin the solid that contain high concentrations of interstitial and vacancy point defects. At sufficiently high point-defect concentrations, cascade r egions are unstable; recombination of interstitial and vacancy point defect s can occur together with the aggregation of point defects into clusters. T hese clusters can collapse into various types of dislocation loop and stack ing-fault tetrahedra which are large enough to produce lattice strain field s that are visible under diffraction-contrast imaging in a transmission ele ctron microscope. The kinetics which drive cascade formation and subsequent collapse are investigated by analysing the microstructure produced in situ by low-fluence 100 keV Kr-ion irradiations of fee Cu over a wide temperatu re range (18-873 K). The product microstructures are characterized by quant itative measurements of the yields of collapsed point-defect clusters. In a ddition, their stabilities, lifetimes and size distributions are also exami ned. Defect yields are demonstrated unequivocally to be temperature depende nt, remaining approximately constant up to lattice temperatures of 573 K an d then abruptly decreasing with increasing temperature. This drop in yield is not caused by defect loss during or following ion irradiation. It rather reflects a decrease in the probability of cascade collapse which can be ex plained by a thermal spike effect.