Atomic force microscopy in the surface characterization of semiconductors and superconductors

In the present paper I summarize the recent experience of my laboratory in the field of atomic force microscopy (AFM) applied to the study of the surf aces of both semiconducting and superconducting materials. I show that very useful results, both in fundamental and in applied physics, can be obtaine d by using simple contact-mode AFM in air, provided that particular attenti on is paid to the vibration isolation of the experimental set-up and to the cleavage of the samples' surface just before the measurement. Some example s are presented from the study of conventional and high-T-c layered superco nductors up to the atomic resolution, to the precise determination of the t hickness of GaAs/AlAs multilayers and of the best deposition parameters for the sputtering of piezoelectric thin films.