A high resolution TOF diffractometer and spectrometer

Citation
F. Demmel et al., A high resolution TOF diffractometer and spectrometer, PHYSICA B, 276, 2000, pp. 116-117
Citations number
5
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA B
ISSN journal
09214526 → ACNP
Volume
276
Year of publication
2000
Pages
116 - 117
Database
ISI
SICI code
0921-4526(200003)276:<116:AHRTDA>2.0.ZU;2-S
Abstract
We propose a combined high-resolution time-of-flight (TOF) diffractometer a nd spectrometer for the new Munich reactor FRM-II. The instrument uses a lo ng flight path and a fast first chopper for the primary spectrometer. The s etup for the secondary spectrometer consists of a back scattering detector for the diffractometer and analyser crystals on an are around the sample po sition for the spectrometer. The relative resolution of the diffractometer will be Delta d/d approximate to 2 x 10(-4) and the energy resolution of th e spectrometer will be 2 mu eV with a silicon analyser system in near back scattering geometry. The dynamic range can be shifted with the chopper syst em by several meV, i.e. it exceeds a crystal back scattering spectrometer b y a factor 50. (C) 2000 Elsevier Science B.V. ALI rights reserved.