The static structure factor S(Q) of partially deuterated ethyl- and hexylmethacrylate polymers

Authors
Meier, G Pawelzik, U Schweika, W Kockelmann, W
Citation
G. Meier et al., The static structure factor S(Q) of partially deuterated ethyl- and hexylmethacrylate polymers, PHYSICA B, 276, 2000, pp. 369-370
Citations number
3
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA B
ISSN journal
09214526 → ACNP
Volume
276
Year of publication
2000
Pages
369 - 370
Database
ISI
SICI code
0921-4526(200003)276:<369:TSSFSO>2.0.ZU;2-E
Abstract
We have performed measurements of the static structure factor S(Q) on Polye thylmethacrylate and Polyhexylmethacrylate on ROTAX at ambient T in the Q-r ange 0.5 < Q/Angstrom(-1) < 4.5 and on the DNS spectrometer at T = 8 K in t he Q-range 0.1 < Q/Angstrom(-1) < 3.2 thereby including spin polarization a nalysis. Each polymer was either deuterated at the side (-ester) chain or a t the main chain giving rise to vastly different partial structure factors. Possible correlations to the structure are given. (C) 2000 Elsevier Scienc e B.V. All rights reserved.