The effect of oxygen presence in sputtering chamber on magnetization of thi
n ( similar to 700-800 Angstrom) FeCo films was studied by polarized neutro
n reflectometry. The samples were prepared by magnetron sputtering of the F
e36Co64 alloy onto glass substrates in the presence of oxygen in the sputte
ring chamber. For a given oxygen content in the sputtering chamber the oxyg
en concentration in the Blm decreased with the sputtering rate. The increas
e in oxygen inside the film was found to decrease its magnetic saturation i
nduction. The exact element depth profiles of the prepared samples was made
by Rutherford back scattering (RBS) technique. (C) 2000 Elsevier Science B
.V. AII rights reserved.