The effect of oxygen presence in sputtering chamber on magnetization of thin FeCo films

Citation
Vm. Pusenkov et al., The effect of oxygen presence in sputtering chamber on magnetization of thin FeCo films, PHYSICA B, 276, 2000, pp. 654-655
Citations number
2
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA B
ISSN journal
09214526 → ACNP
Volume
276
Year of publication
2000
Pages
654 - 655
Database
ISI
SICI code
0921-4526(200003)276:<654:TEOOPI>2.0.ZU;2-M
Abstract
The effect of oxygen presence in sputtering chamber on magnetization of thi n ( similar to 700-800 Angstrom) FeCo films was studied by polarized neutro n reflectometry. The samples were prepared by magnetron sputtering of the F e36Co64 alloy onto glass substrates in the presence of oxygen in the sputte ring chamber. For a given oxygen content in the sputtering chamber the oxyg en concentration in the Blm decreased with the sputtering rate. The increas e in oxygen inside the film was found to decrease its magnetic saturation i nduction. The exact element depth profiles of the prepared samples was made by Rutherford back scattering (RBS) technique. (C) 2000 Elsevier Science B .V. AII rights reserved.