Normal-mode linewidths in a semiconductor microcavity with various cavity qualities

Authors
Hofmann, M Karaiskaj, D Ellmers, C Maxisch, T Jahnke, F Kolbe, HJ Weiser, G Rettig, R Leu, S Stolz, W Koch, SW Ruhle, WW
Citation
M. Hofmann et al., Normal-mode linewidths in a semiconductor microcavity with various cavity qualities, PHYS ST S-A, 178(1), 2000, pp. 179-181
Citations number
4
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH
ISSN journal
00318965 → ACNP
Volume
178
Issue
1
Year of publication
2000
Pages
179 - 181
Database
ISI
SICI code
0031-8965(200003)178:1<179:NLIASM>2.0.ZU;2-Z
Abstract
We measure the normal-mode linewidths in a semiconductor microcavity with v arious exciton-photon interaction strengths. Variation of the normal mode c oupling and thus of the exciton-photon interaction is obtained reducing the cavity quality by stepwise removing of top mirror pairs. Excellent agreeme nt of the measured linewidths with results of a linear dispersion theory is obtained.