Strictly resonant excitation of carriers in self-assembled IuAs/GaAs quantum dots

Citation
M. Paillard et al., Strictly resonant excitation of carriers in self-assembled IuAs/GaAs quantum dots, PHYS ST S-A, 178(1), 2000, pp. 349-353
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH
ISSN journal
00318965 → ACNP
Volume
178
Issue
1
Year of publication
2000
Pages
349 - 353
Database
ISI
SICI code
0031-8965(200003)178:1<349:SREOCI>2.0.ZU;2-9
Abstract
We investigate the carrier dynamics in self-assembled InAs/GaAs quantum dot s under strictly resonant excitation of the ground state. The spectral sele ctivity of the resonant excitation allows to study the physical properties of a class of dots characterized by an energy distribution comparable to th e excitation laser spectrum. We detect no Stokes shift of the photoluminesc ence (PL) line. The PL decay time yields a straightforward determination of the radiative recombination time, tau(rad) similar to 650 ps. Finally we m easure a very short rise time (< 1 ps) of the dots ground state PL after a resonant excitation of the first excited state, which indicates an extremel y fast intra-dot energy relaxation.