P. Thieberger et al., Secondary-electron yields and their dependence on the angle of incidence on stainless-steel surfaces for three energetic ion beams - art. no. 042901, PHYS REV A, 6104(4), 2000, pp. 2901
Secondary-electron yields were investigated for 28-MeV protons, 126-MeV oxy
gen-ions, and 182-MeV gold ions incident on 304 stainless-steel surfaces. T
he dependence on the incidence angle was studied in detail, and a system wa
s developed which allows accurate measurements to be performed over a wide
angular range extending to nearly grazing collisions. Electron yield estima
tes of interest fur future accelerator applications are developed for 1-GeV
protons, and the possible mitigation of deleterious effects by using serra
ted rather than flat surfaces is analyzed.