Thickness dependence of the superconducting transition temperature of La2-xSrxCuO4 films

Citation
Xj. Chen et al., Thickness dependence of the superconducting transition temperature of La2-xSrxCuO4 films, PHYS REV B, 61(14), 2000, pp. 9782-9785
Citations number
34
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
10980121 → ACNP
Volume
61
Issue
14
Year of publication
2000
Pages
9782 - 9785
Database
ISI
SICI code
1098-0121(20000401)61:14<9782:TDOTST>2.0.ZU;2-P
Abstract
A model of the strain effect on the transition temperature T-c of supercond ucting films is presented. Details are given for previously published resul ts on the thickness dependence of T-c in the (001) La1.85Sr0.15CuO4 films. A key role is played by the strain resulting From lattice mismatch between the film and the substrate, which is responsible for the behavior of T-c. C alculations show that the values of T-c of the films on SrLaAlO4 substrates under compressive strain are always higher than those on SrTiO3 under tens ile strain. As the thickness is reduced, the films grown on SrTiO3 substrat es exhibit a rapid reduction of T-c, whereas the T-c increases on SrLaAlO4 substrates. The theoretical results are in good agreement with experiments.