Theory of resonant Rayleigh scattering from semiconductor microcavities: Signatures of disorder

Citation
Av. Shchegrov et al., Theory of resonant Rayleigh scattering from semiconductor microcavities: Signatures of disorder, PHYS REV L, 84(15), 2000, pp. 3478-3481
Citations number
18
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
84
Issue
15
Year of publication
2000
Pages
3478 - 3481
Database
ISI
SICI code
0031-9007(20000410)84:15<3478:TORRSF>2.0.ZU;2-A
Abstract
We develop a self-consistent, microscopic theory of coherent resonant secon dary emission From semiconductor microcavities in the normal-mode-coupling regime. Our theory provides a quantitative description of the spectral, tem poral, and angular properties of the disorder-induced emission component-re sonant Rayleigh scattering-and offers an intuitive physical explanation of emission properties.