The compound K2HZrF7 was prepared and studied by chemical, thermal, and IR
analyses. The unit cell parameters of K2HZrF7 were determined from its X-ra
y diffraction pattern using the data for the isostructural hafnium analog.
Crystallization of K2HZrF7 containing 0.36 wt % Hf from concentrated HF sol
ution was studied.