F. Boroomand et al., Correlation between defect chemistry and expansion during reduction of doped LaCrO3 interconnects for SOFCs, SOL ST ION, 129(1-4), 2000, pp. 251-258
Reduction of doped lanthanum chromite results in a linear expansion of the
sample depending on dopant concentration, temperature, and oxygen content w
ithin the sample. In order to elucidate the defect structure of the perovsk
ite-type oxide solid solution La1-xCaxCrO3-delta (x = 0.10 and 0.20), the n
onstoichiometry delta was measured as a function of oxygen partial pressure
from 900 to 1100 degrees C by means of a thermogravimetric method. The the
rmal expansion in reducing environments was measured as a function of oxyge
n partial pressure at 1000 degrees C and then related to the change in oxyg
en stoichiometry. A linear correlation between thermal expansion and oxygen
nonstoichiometry was found. (C) 2000 Published by Elsevier Science B.V. Al
l rights reserved.