Correlation between defect chemistry and expansion during reduction of doped LaCrO3 interconnects for SOFCs

Citation
F. Boroomand et al., Correlation between defect chemistry and expansion during reduction of doped LaCrO3 interconnects for SOFCs, SOL ST ION, 129(1-4), 2000, pp. 251-258
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SOLID STATE IONICS
ISSN journal
01672738 → ACNP
Volume
129
Issue
1-4
Year of publication
2000
Pages
251 - 258
Database
ISI
SICI code
0167-2738(200004)129:1-4<251:CBDCAE>2.0.ZU;2-L
Abstract
Reduction of doped lanthanum chromite results in a linear expansion of the sample depending on dopant concentration, temperature, and oxygen content w ithin the sample. In order to elucidate the defect structure of the perovsk ite-type oxide solid solution La1-xCaxCrO3-delta (x = 0.10 and 0.20), the n onstoichiometry delta was measured as a function of oxygen partial pressure from 900 to 1100 degrees C by means of a thermogravimetric method. The the rmal expansion in reducing environments was measured as a function of oxyge n partial pressure at 1000 degrees C and then related to the change in oxyg en stoichiometry. A linear correlation between thermal expansion and oxygen nonstoichiometry was found. (C) 2000 Published by Elsevier Science B.V. Al l rights reserved.