Polarization-dependent total-reflection fluorescence EXAFS study about active structures on single crystal oxides as model catalyst surfaces

Authors
Asakura, K Chun, WJ Iwasawa, Y
Citation
K. Asakura et al., Polarization-dependent total-reflection fluorescence EXAFS study about active structures on single crystal oxides as model catalyst surfaces, TOP CATAL, 10(3-4), 2000, pp. 209-219
Citations number
59
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
TOPICS IN CATALYSIS
ISSN journal
10225528 → ACNP
Volume
10
Issue
3-4
Year of publication
2000
Pages
209 - 219
Database
ISI
SICI code
1022-5528(2000)10:3-4<209:PTFESA>2.0.ZU;2-Y
Abstract
We review recent development of a polarization-dependent total-reflection f luorescence EXAFS technique applied to Co3O4/Al2O3(0001), Pt/Al2O3(0001), a nd Mo/TiO2(110). We would like to stress that the polarization-dependent to tal-reflection fluorescence EXAFS has become a practical tool for a charact erization of three-dimensional local structure of active sites in model sup ports.