Jm. Zuo et al., Surface structural sensitivity of convergent-beam RHEED: Si (001)2x1 models compared with dynamical simulations, ULTRAMICROS, 81(3-4), 2000, pp. 235-244
The aim of this work is to evaluate the sensitivity of convergent-beam RHEE
D for the refinement of surface atomic structure. We have compared experime
ntal and theoretical convergent-beam RHEED patterns from the silicon (0 0 1
) reconstructed surface. The experiment was carried out in a custom designe
d UHV diffraction camera,using a micron sized probe. Both experimental and
theoretical CB-RHEED patterns show complex details, highly sensitive to the
surface structure. The multiple scattering simulations were based on two e
xperimental structural models which make different assumptions for dimer ti
lt, one derived from X-ray diffraction results, and another from LEED data.
The simulated CB-RHEED patterns using the X-ray model were found to be in
closer agreement with our experiment than the LEED model. However, the agre
ement is not entirely satisfactory, suggesting that further improvement on
this model is necessary. (C) 2000 Elsevier Science B.V. All rights reserved
.