WAVELENGTH DISPERSIVE MEASUREMENTS OF CHARACTERISTIC K X-RAYS OF AN ECR KRYPTON PLASMA

Citation
C. Heinzelmann et al., WAVELENGTH DISPERSIVE MEASUREMENTS OF CHARACTERISTIC K X-RAYS OF AN ECR KRYPTON PLASMA, Hyperfine interactions, 108(1-3), 1997, pp. 51-58
Citations number
16
Categorie Soggetti
Physics, Atomic, Molecular & Chemical","Physics, Nuclear","Physics, Condensed Matter
Journal title
ISSN journal
03043843
Volume
108
Issue
1-3
Year of publication
1997
Pages
51 - 58
Database
ISI
SICI code
0304-3843(1997)108:1-3<51:WDMOCK>2.0.ZU;2-T
Abstract
X-rays from different transitions of the K series were used to analyze components of the ion charge state distribution inside a microwave he ated krypton plasma. It is shown that X-ray transitions involving oute r-shell electrons show spectra with clearly resolvable satellite lines arising from low charged ions. In contrast to the evaluation of K-alp ha spectra this allows to get information about the ion charge state d istribution in the low ionization region.