Ferroelectricity and structure of BaTiO3 grown on YBa2Cu3O7-delta thin films

Citation
C. Schwan et al., Ferroelectricity and structure of BaTiO3 grown on YBa2Cu3O7-delta thin films, EUR PHY J B, 14(3), 2000, pp. 477-481
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
EUROPEAN PHYSICAL JOURNAL B
ISSN journal
14346028 → ACNP
Volume
14
Issue
3
Year of publication
2000
Pages
477 - 481
Database
ISI
SICI code
1434-6028(200004)14:3<477:FASOBG>2.0.ZU;2-4
Abstract
We have investigated the crystal structure and the ferroelectric properties of BaTiO3 thin films with YBa2Cu3O7-delta as the bottom and Au as the top electrode. Epitaxial heterostructures of YBa2Cu3O7-delta and BaTiO3 were pr epared bg de and rf sputtering, respectively. The crystal structure of the films nias characterised by X-ray diffraction.. The ferroelectric behaviour of the BaTiO3 films was confirmed by hysteresis loop measurements using a Sawyer Tower circuit. We obtain a coercive field of 30 kV/cm and a remanent polarisation of 1.25 mu C/cm(2). At sub-switching fields the capacitance o f the films obeys a relation analogous to the Rayleigh law. This behaviour indicates an interaction of domain walls with randomly distributed pinning centres. At a field of 5 MV/m we calculate a 3% contribution of the irrever sible domain wall motion to the total dielectric constant.