Microphase separation in amorphous Pd-Si alloys studied by electron diffraction and HREM

Citation
T. Ohkubo et al., Microphase separation in amorphous Pd-Si alloys studied by electron diffraction and HREM, J ELEC MICR, 48, 1999, pp. 1005-1013
Citations number
30
Categorie Soggetti
Multidisciplinary
Journal title
JOURNAL OF ELECTRON MICROSCOPY
ISSN journal
00220744 → ACNP
Volume
48
Year of publication
1999
Supplement
S
Pages
1005 - 1013
Database
ISI
SICI code
0022-0744(1999)48:<1005:MSIAPA>2.0.ZU;2-R
Abstract
Structures of amorphous Pd82Si18 and Pd75Si25 alloys have been investigated from a viewpoint of 'microphase separation'. In these alloys a local atomi c ordering called medium range order (MRO) with sizes of 1-2 nm was observe d by high-resolution electron microscopy (HREM). From nanodiffraction studi es, atomic structures of the MRO regions in the amorphous Pd82Si18 and Pd75 Si25 structures were determined as those of fcc-Pd-type and hexagonal-Pd2Si -type, respectively. Atomic pair distribution function (PDF) analyses for t hese alloys were performed by precise measurements of halo-electron diffrac tion intensities. In order to explain both the results of HREM and PDF stud ies,'microphase separation' structure models have been constructed for thes e alloys with the help of reverse Monte-Carlo calculations. Structure model s with MRO regions embedded in a dense-random-packing structure of Pd and S i were finally obtained, which could explain the experimental PDFs satisfac torily.