Hq. Ye et al., HREM observation and compositional study of microstructure and phase transformation in TiAl-based and Cu-Al-Ni alloys, J ELEC MICR, 48, 1999, pp. 1099-1106
Characterization of atomic configuration on an atomic scale is required for
the development of advanced materials, as well as chemical compositions an
d electronic structures. In this paper, by using FEGTEM, studies of phase t
ransformations and synthetic characterization of precipitated phase were ca
rried out on a nanometer/an atomic scale in TiAl intermetallics and Cu-AlNi
shape memory alloy, respectively. In TiAl intermetallics, a deformation-in
duced phase transformation at room temperature was observed on the several-
ten-nanometer region in the Ti50Al48Cr2 alloy. It is a diffusionless phase
transformation and a Ti3Al alpha(2) phase is formed as a metastable phase.
On the other hand, a Ti2Al zeta phase was identified in another Al-rich TiA
l with a composition of Ti48.3Al51.7 It was formed during the precipitation
of Ti3Al alpha(2) plate in the TiAl gamma matrix. It was found that this p
recipitation was achieved through a two-step transition and Ti2Al zeta is a
n intermediate phase in the phase transformation. Characterization of chi p
articles was carried out in the shape memory Cu-Al-Ni alloy containing smal
l amount of Ti and Mn. Many small precipitates of 18-100 nm in size were fo
rmed in the chi(L) phase. The composition of chi L phase was (NiAl)(2)CuTi,
while the small precipitates were almost Cu-3(Al,Ni,Ti,Mn).