Photoisomerization of disperse red one in films of poly(methyl-methacrylate) at high pressure

Evanescent wave optics under high pressure is developed for the optical and mechanical characterization of thin films. Both the attenuated total refle ction in the Kretschmann configuration and the grating coupling techniques are implemented. We apply total internal reflection and surface optical wav e, e.g. surface plasmon spectroscopy, in order to gain information about th e pressure dependence of the optical and mechanical properties of the press ure medium and the metal coupling layer. Optical modes guided in thin films allow us to characterize the pressure effects on these films. We show that hydrostatic pressure applied to thin polymer films increases their refract ive index and decreases their thickness. The pressure increases the density of these films by a reduction of the free volume. As far as microscopic en vironments are concerned, we show that the molecular movement induced by ph oto- and thermal isomerization of an azo chromophore flexibly tethered to a poly(methyl-methacrylate) polymer is hindered by increasing the pressure. (C) 2000 Elsevier Science B.V. All rights reserved.