Microstructural characterization of sintered MoSi2/SiCp composites

Citation
J. Li et al., Microstructural characterization of sintered MoSi2/SiCp composites, J AM CERAM, 83(4), 2000, pp. 992-994
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF THE AMERICAN CERAMIC SOCIETY
ISSN journal
00027820 → ACNP
Volume
83
Issue
4
Year of publication
2000
Pages
992 - 994
Database
ISI
SICI code
0002-7820(200004)83:4<992:MCOSMC>2.0.ZU;2-D
Abstract
A MoSi2/SiCP composite was synthesized by in situ reactive sintering of a m ixture of molybdenum, silicon, and carbon powders. Its microstructural feat ures were studied by X-ray energy dispersive spectroscopy (EDS), convention al transmission electron microscopy (CTEM), and high-resolution transmissio n electron microscopy (HREM). It was determined that the composite was comp osed of alpha-MoSi2 and beta-SIC, There were no specific orientation relati onships between the MoSi2, matrix and SiCp, because the MoSi2 and SiC were formed at 1450 degrees C by the reaction of solid Mo and C and liquid Si. T he abrupt change occurring in the microstructure of the composite is explai ned by the presence of an interface between MoSi2, and SiCp, where no obser vable SiO2 amorphous layer or particles were found. Microtwins and stacking faults were frequently observed in {111} planes of SiCp.