Bn. Kim, Two-dimensional simulation of grain growth based on an atomic jump model for grain boundary migration, MAT SCI E A, 283(1-2), 2000, pp. 164-171
The kinetics and the topological phenomena during two-dimensional grain gro
wth are studied by computer simulations based on an atomic jump model for g
rain boundary migration. The grain boundaries are assumed to be straight. T
he kinetics show the 1/2-power growth law for the average grain size, and t
he size and the side distributions;are time-invariant. In particular, the s
imulated side distribution is well consistent with the theoretical predicti
on, The present simulation follows the Aboav-Weaire law for entire topologi
cal classes. the Lewis law for intermediate topological classes and the von
Neumann-Mullins law for intermediate and high classes. The deviation from
the von Neumann-Mullins law for low topological classes is reduced by takin
g account of the effects of curved grain boundaries. The other distinctive
results of the simulation are also shown and discussed. (C) 2000 Elsevier S
cience S.A. All rights reserved.