Two-dimensional simulation of grain growth based on an atomic jump model for grain boundary migration

Authors
Citation
Bn. Kim, Two-dimensional simulation of grain growth based on an atomic jump model for grain boundary migration, MAT SCI E A, 283(1-2), 2000, pp. 164-171
Citations number
28
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
ISSN journal
09215093 → ACNP
Volume
283
Issue
1-2
Year of publication
2000
Pages
164 - 171
Database
ISI
SICI code
0921-5093(20000515)283:1-2<164:TSOGGB>2.0.ZU;2-J
Abstract
The kinetics and the topological phenomena during two-dimensional grain gro wth are studied by computer simulations based on an atomic jump model for g rain boundary migration. The grain boundaries are assumed to be straight. T he kinetics show the 1/2-power growth law for the average grain size, and t he size and the side distributions;are time-invariant. In particular, the s imulated side distribution is well consistent with the theoretical predicti on, The present simulation follows the Aboav-Weaire law for entire topologi cal classes. the Lewis law for intermediate topological classes and the von Neumann-Mullins law for intermediate and high classes. The deviation from the von Neumann-Mullins law for low topological classes is reduced by takin g account of the effects of curved grain boundaries. The other distinctive results of the simulation are also shown and discussed. (C) 2000 Elsevier S cience S.A. All rights reserved.