Pump-probe differential transmission measurements examine high-carrier
-density phenomena in as-grown and annealed GaAs samples grown at temp
eratures from 210 to 270 degrees C. We observe trap saturation and Aug
er recombination, and accurately model the measurements on annealed sa
mples with a simple two level rate equation, allowing us to extract th
e trapped-electron lifetimes. (C) 1997 American Institute of Physics.