Microstructural properties of BaTiO3 ceramics and thin films

Authors
Cruz, AF Portelles, JJ Siqueiros, JM
Citation
Af. Cruz et al., Microstructural properties of BaTiO3 ceramics and thin films, REV MEX FIS, 46(2), 2000, pp. 148-151
Citations number
17
Categorie Soggetti
Physics
Journal title
REVISTA MEXICANA DE FISICA
ISSN journal
0035001X → ACNP
Volume
46
Issue
2
Year of publication
2000
Pages
148 - 151
Database
ISI
SICI code
0035-001X(200004)46:2<148:MPOBCA>2.0.ZU;2-J
Abstract
A microstructural study of BaTiO3 ceramics obtained by the conventional cer amic method is presented. Targets were produced to grow BaTiO3 thin films b y pulsed laser deposition on Pt/Ti/Si(100) substrates. X-ray diffraction, A uger Electron Spectroscopy, X-ray Photon Spectroscopy and Scanning Electron Microscopy were used to study the properties of the BaTiO3 ceramic samples and thin films, as deposited and after an annealing process.