Structural model of thin (GeSe5)(1-x)Tl-x films

Citation
P. Petkov et T. Petkova, Structural model of thin (GeSe5)(1-x)Tl-x films, SEMIC SCI T, 15(4), 2000, pp. 331-334
Citations number
23
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
ISSN journal
02681242 → ACNP
Volume
15
Issue
4
Year of publication
2000
Pages
331 - 334
Database
ISI
SICI code
0268-1242(200004)15:4<331:SMOT(F>2.0.ZU;2-I
Abstract
Far-infrared spectra of thin films from the Ge-Se-Tl system are investigate d. The results are interpreted in terms of the vibrations of the isolated m olecular units. The experimental results are compared with simulated spectr a based on the theory of strong oscillators. Six optical phonons are found using a spectral computer program ('Layers'). Raman spectra of thin films f rom the Ge-Se-Tl system are investigated. Modes associated with the Se-Se, Se-Ge and Se-TI bonds are obtained. On the basis of the determined bonds a structural model of the glasses is proposed.