A new method for modulating the mobility of the majority and minority charg
e carriers in silicon was studied. It is shown that, under the effect of lo
cal avalanche breakdown of a p-n junction, the charge-carrier mobility in t
he bulk of the semiconductor increases or decreases, depending on the orien
tation of the p-n junction subjected to breakdown in relation to the direct
ion of motion of the charge carriers. (C) 2000 MAIK "Nauka/Interperiodica".