The preparation and demonstration of epitaxial La0.67Sr0.33Mn3-delta films/((110) orientation)

Authors
Xiong, CS Pi, L Xiong, YH Jia, YB Zhou, GE Jian, ZP Li, XG
Citation
Cs. Xiong et al., The preparation and demonstration of epitaxial La0.67Sr0.33Mn3-delta films/((110) orientation), SOL ST COMM, 114(6), 2000, pp. 341-345
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SOLID STATE COMMUNICATIONS
ISSN journal
00381098 → ACNP
Volume
114
Issue
6
Year of publication
2000
Pages
341 - 345
Database
ISI
SICI code
0038-1098(2000)114:6<341:TPADOE>2.0.ZU;2-K
Abstract
The X-ray diffraction patterns and pole figures of the La0.67Sr0.33MnO3-del ta films, which were fabricated on (110) LaAlO3 single-crystal substrates u sing the direct current magnetron sputtering technique were studied systema tically. It is concluded that all films are high-quality epitaxial films an d there is a perfect matching relationship between the films and the substr ates. The effect of the different orientations ((110) and (100)) on the res istivity and metal-insulator transition temperature is briefly discussed. ( C) 2000 Elsevier Science Ltd. All rights reserved.