Resonant Raman scattering in (Al,Ga)N/GaN quantum well structures

Citation
J. Gleize et al., Resonant Raman scattering in (Al,Ga)N/GaN quantum well structures, THIN SOL FI, 364(1-2), 2000, pp. 156-160
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
364
Issue
1-2
Year of publication
2000
Pages
156 - 160
Database
ISI
SICI code
0040-6090(20000327)364:1-2<156:RRSI(Q>2.0.ZU;2-0
Abstract
We report on Raman scattering in hexagonal GaN quantum wells embedded in Al 0.11Ga0.89N barriers, The six monolayers thick quantum wells, grown by mole cular beam epitaxy, are deposited on a GaN buffer layer. Resonant enhanceme nt of the Raman lines associated with the A(1)(LO) phonon of GaN has been a chieved using excitation lines in the 3.5-3.8 eV range, which allows select ive probing of the wells, the barriers and the buffer layer. Strong A(1)(LO ) multiphonon scattering is observed for incident or scattered photon energ y in resonance with the lowest electronic transitions in the quantum wells. (C) 2000 Published by Elsevier Science S.A.